Decision feedback equalization correction of eye scope measurements

ABSTRACT

Methods and systems are described for obtaining a plurality of BER-specific correction values by comparing a first set of BER values obtained by sampling, at a sampling instant near the center of a signaling interval, a non-DFE corrected received signal with a second set of BER values obtained by sampling a DFE-corrected received signal at the sampling instant. A set of eye-scope BER measurements are obtained, each eye-scope BER measurement having a sampling offset relative to the sampling instant, a voltage offset value representing a voltage offset applied to alter a decision threshold, and an eye-scope BER value. A set of DFE-adjusted eye-scope BER measurements are generated by using BER-specific correction values to adjust the voltage offset values of the eye-scope BER measurements.

CROSS-REFERENCE TO RELATED APPLICATIONS

This application claims the benefit of U.S. Provisional Application No.62/595,690, filed Dec. 7, 2017, naming Richard Simpson, entitled“Decision Feedback Equalization Correction of Eye Scope Measurements”,which is hereby incorporated herein by reference in its entirety for allpurposes.

REFERENCES

The following prior applications are herein incorporated by reference intheir entirety for all purposes:

U.S. Patent Publication 2011/0268225 of application Ser. No. 12/784,414,filed May 20, 2010, naming Harm Cronie and Amin Shokrollahi, entitled“Orthogonal Differential Vector Signaling” (hereinafter “Cronie I”).

U.S. patent application Ser. No. 13/842,740, filed Mar. 15, 2013, namingBrian Holden, Amin Shokrollahi and Anant Singh, entitled “Methods andSystems for Skew Tolerance in and Advanced Detectors for VectorSignaling Codes for Chip-to-Chip Communication”, hereinafter identifiedas [Holden I];

U.S. patent application Ser. No. 14/926,958, filed Oct. 29, 2015, namingRichard Simpson, Andrew Stewart, and Ali Hormati, entitled “Clock DataAlignment System for Vector Signaling Code Communications Link”,hereinafter identified as [Stewart I].

U.S. patent application Ser. No. 14/925,686, filed Oct. 28, 2015, namingArmin Tajalli, entitled “Advanced Phase Interpolator”, hereinafteridentified as [Tajalli I].

U.S. Provisional Patent Application No. 62/286,717, filed Jan. 25, 2016,naming Armin Tajalli, entitled “Voltage Sampler Driver with EnhancedHigh-Frequency Gain”, hereinafter identified as [Tajalli II].

U.S. patent application Ser. No. 15/603,404 filed May 23, 2017, namingArmin Tajalli, entitled “Phase Rotation Circuit for Eye ScopeMeasurements”, hereinafter identified as [Tajalli III].

FIELD OF THE INVENTION

The present embodiments relate to communications systems circuitsgenerally, and more particularly to the acquisition and presentation ofgraphical performance information associated with operation of ahigh-speed multi-wire interface used for chip-to-chip communication.

BACKGROUND

In modern digital systems, digital information has to be processed in areliable and efficient way. In this context, digital information is tobe understood as information available in discrete, i.e., discontinuousvalues. Bits, collection of bits, but also numbers from a finite set canbe used to represent digital information.

In most chip-to-chip, or device-to-device communication systems,communication takes place over a plurality of wires to increase theaggregate bandwidth. A single or pair of these wires may be referred toas a channel or link and multiple channels create a communication busbetween the electronic components. At the physical circuitry level, inchip-to-chip communication systems, buses are typically made ofelectrical conductors in the package between chips and motherboards, onprinted circuit boards (“PCBs”) boards or in cables and connectorsbetween PCBs. In high frequency applications, microstrip or striplinePCB traces may be used.

Common methods for transmitting signals over bus wires includesingle-ended and differential signaling methods. In applicationsrequiring high speed communications, those methods can be furtheroptimized in terms of power consumption and pin-efficiency, especiallyin high-speed communications. More recently, vector signaling methodshave been proposed to further optimize the trade-offs between powerconsumption, pin efficiency and noise robustness of chip-to-chipcommunication systems. In those vector signaling systems, digitalinformation at the transmitter is transformed into a differentrepresentation space in the form of a vector codeword that is chosen inorder to optimize the power consumption, pin-efficiency and speedtrade-offs based on the transmission channel properties andcommunication system design constraints. Herein, this process isreferred to as “encoding”. The encoded codeword is communicated as agroup of signals from the transmitter to one or more receivers. At areceiver, the received signals corresponding to the codeword aretransformed back into the original digital information representationspace. Herein, this process is referred to as “decoding”.

Regardless of the encoding method used, the received signals presentedto the receiving device must be sampled (or their signal value otherwiserecorded) at intervals best representing the original transmittedvalues, regardless of transmission channel delays, interference, andnoise.

To enable diagnostic and/or quality assurance monitoring, additionalsampling capabilities may be provided with outputs directed to amanagement or control/status interface, allowing real-time orstatistical assessment of interface behavior. In some cases, the timingand sampling threshold for such additional sampling may be controlledindependent of data reception, allowing background collection of datawhich may be displayed in a so-called “eye scope” representationillustrating historical signal amplitudes and timings relative to thecurrent data detection threshold and sampling time.

BRIEF DESCRIPTION

To reliably detect the data values transmitted over a communicationssystem, a receiver must accurately measure the received signal valueamplitudes at carefully selected times. Various methods are known tofacilitate such receive measurements, including reception of one or morededicated clock signals associated with the transmitted data stream,extraction of clock signals embedded within the transmitted data stream,and synthesis of a local receive clock from known attributes of thecommunicated data stream.

In general, the receiver embodiments of such timing methods aredescribed as Clock-Data Recovery (CDR), often based on Phase-Lock Loop(PLL) or Delay-Locked Loop (DLL) synthesis of a local receive clockhaving the desired frequency and phase characteristics.

In both PLL and DLL embodiments, a Phase Detector compares the relativephase (and in some variations, the relative frequency) of a receivedreference signal and a local clock signal to produce an error signal,which is subsequently used to correct the phase and/or frequency of thelocal clock source and thus minimize the error. As this feedback loopbehavior will lead to a given PLL embodiment producing a fixed phaserelationship (as examples, 0 degrees or 90 degrees of phase offset)between the reference signal and the local clock, an additional fixed orvariable phase adjustment is often introduced to permit the phase offsetto be set to a different desired value (as one example, 45 degrees ofphase offset) to facilitate receiver data detection.

Statistical graphs of received data over time, commonly called “eyediagrams” are a well-known tool for analyzing received signal quality.Capturing the data needed to plot such a diagram includes measuringreceived signals at multiple sampling points distributed across bothsignal amplitude and time. To avoid disruption of normal data reception,one or more additional data samplers may be provided to perform thesemeasurements independent of the amplitude threshold and time intervalchosen for optimum data reception.

In some communications networks, variations in network propagationcharacteristics can induce signal attenuations and reflections thatmanifest as interference to subsequently transmitted data, as so-calledInter-Symbol Interference or ISI.

Decision Feedback Equalization (DFE) is one well-known technique used tocompensate for the effects of ISI. A receiver maintains a history ofpreviously received data values and uses an internal model or estimationof network characteristics to compute the ISI effects those previousdata values would produce on such a network. The model is typicallyreferred to as a channel model, channel taps, or channel impulseresponse. This estimation, known as the DFE correction, may then beapplied to the currently received signal prior to data sampling,improving received signal quality.

Because the DFE correction is dynamically computed based on thehistorical time sequence of previously received data values, itinherently also changes over time, complicating its application toinformation obtained at a different sampling time, such as theinformation used to plot eye diagrams. In particular, eye diagramsamples may be unable to take advantage of the data sample's DFEcorrection: the result of that computation may not yet be available foreye samples obtained earlier than (i.e., displayed to the left of) thereceived data sampling time, while that computation's result may alreadybe obsolete for eye samples obtained later than (i.e. displayed to theright of) the received data sampling time.

Methods and systems are described that (i) determine an uncorrected eyediagram, (ii) measure an improvement to the eye-opening at the center ofthe eye afforded by the use of DFE, and (iii) use the measuredimprovement to provide a corrected eye diagram. Such methods may includegenerating, using a data sampler, a sequence of data decisions at areference sampling instant using a reference voltage, generating a setof error counts, each error count generated by comparing decisions froman eye sampler formed at a respective sampling instant of a plurality ofsampling instants using a respective voltage offset of a plurality ofvoltage offsets to corresponding data decisions of the sequence of datadecisions, and generating a set of DFE-compensated error counts, eachDFE-compensated error count generated by comparing decisions from theeye sampler formed using a DFE-modified voltage offset at the referencesampling instant to corresponding data decisions of the sequence of datadecisions.

Furthermore, methods and systems are described for obtaining respectiveerror counts for a plurality of measurement points, each measurementpoint corresponding to a data decision at a respective sampling instantaccording to a respective offset voltage, and obtaining respectiveDFE-compensated error counts for a subset of measurement points of theplurality of measurement points, the subset of measurement pointscomprising measurement points taken at a reference sampling instant at aplurality of DFE-modified voltage offsets. Such a method may furtherinclude determining a DFE-compensation offset based on a selectedDFE-compensated error count and a corresponding error count for ameasurement point taken at the reference sampling instant, the selectedDFE-compensated error count and the corresponding error count havingequal bit-error rates (BERs).

Methods and systems are described for obtaining eye measurements bygenerating a data-sampling clock and a variable-phase-offseteye-measurement clock with a local oscillator and an adjustable phaseinterpolator, using said sampling clock with a data sampler to obtain areceive sample of a received data signal, using at least one eye samplerand the variable-phase-offset eye-measurement clock to obtain aplurality of eye characteristic measurements by adjusting a voltageoffset of the at least one eye sampler and a phase offset of thevariable-phase-offset eye-measurement clock, and adjusting the displayedcharacteristics of the obtained eye measurements utilizing independentlyobtained correction information derived from measurements ofDFE-corrected and uncorrected received data statistics.

BRIEF DESCRIPTION OF FIGURES

FIG. 1 is a block diagram of a system capable of encoding andtransmitting five data bits and a clock on an eight wire communicationschannel.

FIG. 2 is a block diagram of one embodiment of a receiver compatiblewith the system of FIG. 1.

FIG. 3 is a block diagram detailing one embodiment of the clock recoverycircuit used by the receiver of FIG. 2.

FIG. 4 details one embodiment of a receive processing phase.

FIG. 5 is a flowchart of a method, in accordance with some embodiments.

FIG. 6 shows an unequalized waveform of a data signal, in accordancewith some embodiments.

FIG. 7 is an eye diagram of the unequalized data signal, in accordancewith some embodiments.

FIG. 8 is a color-coded version of the eye diagram of FIG. 7,illustrating portions of the eye diagram for which the current bit is a‘1’ and the current bit is a ‘0’.

FIG. 9 is an eye diagram formed using e.g., the waveform of FIG. 7 andapplying decision feedback equalization (DFE) correction, in accordancewith some embodiments.

FIG. 10 shows measured eye information processed to obtain contour linesof constant Bit Error Rate (BER).

FIG. 11 illustrates BER contour lines for different transition patternsfor 1-to-1 transitions (top) and 1-to-0 transitions (bottom), inaccordance with some embodiments.

FIG. 12 is an eye diagram that is equalized using a set of historicalDFE correction factors except for the immediate prior history bit.

FIG. 13 is a set of plots illustrating BER's with and without DFEcorrection for current bit equaling ‘1’ and ‘0’.

FIG. 14 is a set of plots illustrating trace waveforms with and withoutDFE (top) and BER contours with and without DFE (bottom).

FIG. 15 is a plot of BER contours with and without DFE (left) and a plotof shifted uncorrected BER contours as determined by theDFE-compensation offset (right).

FIG. 16 is a block diagram of a DFE-offset voltage generator, inaccordance with some embodiments.

FIG. 17 is a block diagram of an error count circuit, in accordance withsome embodiments.

FIG. 18 is a block diagram of a cascaded sampler for introducing DFEcorrection into the received data signal, in accordance with someembodiments.

FIG. 19 is a flow diagram of a method 1900, in accordance with someembodiments.

DETAILED DESCRIPTION

As described in [Cronie I], vector signaling codes may be used toproduce extremely high bandwidth data communications links, such asbetween two integrated circuit devices in a system. As illustrated bythe embodiment of FIG. 1, multiple data communications channels transmitsymbols of the vector signaling code, acting together to communicatecodewords of the vector signaling code. Depending on the particularvector signaling code used, the number of channels comprising acommunications link may range from two to eight or more, and may alsocommunicate one or more clock signals on separate communicationschannels or as sub-channel components of the vector signaling code. Inthe example of FIG. 1, communication link 120 is illustrated as beingcomposed of eight wires 125, collectively communicating five data values100 and one clock 105 between transmitter 110 and receiver 130.

Some embodiments additionally support additional modes of operation inwhich, as one example, some number of data communications channels arereconfigured to support legacy communications protocols such asnon-return-to-zero (NRZ) differential signaling.

Receiver Data Detection

To provide context for the following examples, one typical high-speedreceiver embodiment [Stewart I] is used for illustrative purposes,without limitation. As illustrated in FIG. 2, the example data receiverincludes eight identical Continuous Time Linear Equalization (CTLE)stages 210 operating on the signals received on the eight wires,previously shown as 120 in FIG. 1.

As described in [Holden I], vector signaling codes may be efficientlydetected by linearly combining sets of input signals using Multi-Inputcomparators or mixers (MIC). For the 5b6w code used by the examplereceiver, five such MICs acting on weighted subsets of the six receiveddata input signals will detect the five data bits without need offurther decoding. In one embodiment, one additional MIC acting oncombinations of the two received clock signals will similarly detect theclock signal.

Other embodiments may forgo the dedicated wires used to communicate aseparate clock signal, and instead may extract a clock from transitionsoccurring on the data lines themselves. FIG. 2 illustrates a set of fiveMIC mixers 220 operate on the received and equalized signals to producedetected signals MIC0-MIC4, with transitions on those data linescollectively used to synchronize a local clock generator 300.

Because of the high data rates involved, multiple parallel phases ofreceive processing are shown in the example receiver. In the illustratedexample, the five detected data signals MIC0-MIC4 are processed in fourparallel phases of receive data processing, each phase 230 includingdata sampling and subsequent buffering, followed by optionalrecombination of the four phase outputs into a single received datastream, shown in FIG. 2 as being performed by multiplexers 240.

Clock Recovery circuits (also known in the art as Clock Data Recovery orCDR) support such sampling measurements by extracting timinginformation, either from the data lines themselves or from dedicatedclock signal inputs, and utilize that extracted information to generateclock signals to control the time interval used by the data linesampling device(s). The actual clock extraction may be performed usingwell known circuits such as a Phase Locked Loop (PLL) or Delay LockedLoop (DLL), which in their operation may also generate higher frequencyinternal clocks, multiple clock phases, etc. in support of receiveroperation. In the embodiment of FIG. 2, the detected clock signal isobtained from data transitions on MIC0-MIC4 and processed 300 to extractproperly timed sampling clocks for the four data phases. DecisionFeedback Equalization or DFE is one well known technique used tocompensate for the effects of ISI. A receiver maintains a history ofpreviously received data values, and uses an internal model orestimation of network characteristics to compute the ISI effects thoseprevious data values would produce on such a network. This estimation,known as the DFE correction, may then be applied to the currentlyreceived signal prior to data sampling, improving received signalquality. In some embodiments, all of the necessary previous data valuesmay not be fully resolved at the time that the DFE correction must beapplied to the immediate received signal. In these cases, so called“loop unrolled” or “speculative” DFE may be performed, wherein one ormore DFE terms are applied in anticipation that the previous data was a‘1’ and that it was a ‘0’. These tentative results are retained untilthe previous data value is known, at which time the proper result ischosen for subsequent use.

Additional details of clock extraction and DFE correction may be foundin [Stewart I].

Obtaining Eye Diagram Measurements

In at least one embodiment, individual clock source selections may bemade for the samplers associated with data and clock edge detection, andwith auxiliary functions such as gathering statistical eye graph dataand calibration. In such embodiments, clock source selections mayinclude an unmodified clock provided by the Receiver Clock System, anincrementally delayed clock provided by a configurable delay element,and/or a separately phase adjustable clock used for statistical eyegraph sampling.

The value of such “eye diagram” measurements is well understood in theart, providing an easily-understood presentation of multiple receivercharacteristics, including receive signal amplitude margin, timingmargin, and error counts. Other characteristics, including bandwidth,equalization, system gain, etc. may also be inferred. Such data maysuggest or initiate system adjustments or controls, including transmitpower adjustment, receiver gain adjustment, baud rate adjustment, andreceive equalization adjustment.

FIG. 4 illustrates these components combined in one embodiment of aprocessing phase 300, as previously described in relation to FIG. 3. Asampling clock produced by VCO1 or VCO2 may be selected by multiplexer410, and optionally delayed by adjustable delay buffer 420. Thepreviously-described data sampling function is shown in this embodimentas four clocked samplers including eye sampler 450 and 453 and datasamplers 451 and 452. In one embodiment, the samplers are clocked analogintegrate-and-hold elements, although no limitation is implied as knownart sample-and-hold, track-and-hold, clocked comparator, and othercomparable circuits are equally applicable.

Each sampler accepts an input data signal at D, and compares the stateof D relative to an offset voltage threshold Th at a sampling instantdetermined by a clock signal ck with the sliced decision available atoutput Q. In some embodiments, the input data signal may correspond tothe output of a MIC, or alternatively the input data signal may be adifferential signal detected using a differential comparator. Nolimitation is implied, as the techniques described below are functionalfor a variety of data transmission schemes. Data samplers 451 and 452are provided with speculative DFE correction values +vh1 and −vh1,corresponding to previous data values ‘1’ and ‘0’ respectively togenerate a sequence of data decisions. One of results D/E1 and D/E2 willbe chosen by multiplexer 460 as received data decision, with the otherresult (a potential edge transition) optionally also directed bymultiplexer 461 to Phase Comparator/Charge Pump 470 to produce a PhaseError signal for the PLL.

A comparable multiplexer to that illustrated as 460 selects betweendecisions Eye1 and Eye2 from eye samplers 450 and 453 based on theprevious received data value, to obtain a measurement result forgeneration of a statistical eye diagram corresponding to amplitudethresholds +vey, −vey and the timing offset provided by adjustable delaybuffer 430.

In an alternative embodiment, phase interpolators may be used instead ofadjustable delay buffers. Thus, as one example, 430 is a phaseinterpolator producing a variable-phase-offset clock which eye samplers450 and 453 may use for eye measurement.

In a further embodiment, a single eye sampler may be used, generating adecision that may be retained or discarded depending on the eventualresolution of the previous data value. In some embodiments, decisions ofthe Eye sampler are compared to the (eventually) determined datadecisions from the data sampler, with an error count of incorrectresults being retained. Such an error count may be retained over aplurality of measuring points, each measuring point defined by arespective sampling instant of a plurality of sampling instants and arespective voltage offset of a plurality of voltage offsets. In yetanother embodiment, each error count may be pattern-specific, e.g.,counts of errors in received ones (i.e. eye sampler detection of a zerowhen a data one was actually received) and received zeroes (i.e. eyesampler detection of a data one when a data zero was actually received)are maintained. Such error counts may be output and used to develop biterror rates (BER). Typically, such BER information may be measured byanalyzing each error count over increments of thousand, million,billion, etc. received values.

FIG. 19 is a flow diagram of a method 1900, in accordance with someembodiments. As shown, method 1900 includes generating 1902, using adata sampler 451/452, a sequence of data decisions D at a referencesampling instant using a reference voltage. As shown in FIG. 4, thereference voltage may be a speculative DFE offset, and the data decisionis subsequently selected according to a previous bit, however a datasampler utilizing a fixed reference voltage may also be used. In stillfurther embodiments, the data decisions may be determined according to aknown or otherwise predetermined data pattern, rather than from actualreceived data processed via a data slicer. Method 1900 further includesgenerating 1904 a set of error counts, each error count generated bycomparing decisions, e.g., eye 1, from an eye sampler 450 formed at arespective sampling instant of a plurality of sampling instants using arespective voltage offset +vey of a plurality of voltage offsets tocorresponding data decisions D of the sequence of data decisionsgenerated by data samplers 451, 452. Error counts may be generated at aset of measurement points, where each measurement point is defined bythe respective sampling instant and the respective voltage offset. Ateach measurement point, thousands, millions, billions, etc. of decisionsgenerated by eye sampler 450 may be provided to error count 480 alongwith corresponding resolved data decisions of the sequence of datadecisions that are made in the same sampling interval. The decision ofeye sampler 450 and the resolved data decision may be compared to see ifthey are the same (no error) or if they are different (error). Errorcount circuit 480 may generate such comparisons may be done using e.g.,a logical exclusive OR gate as shown in FIG. 17. Error counts may bedetermined across a plurality of different sampling instants and aplurality of different voltage thresholds to effectively provide a 2Dmap of error counts.

The method 1900 further includes generating 1906 a set ofDFE-compensated error counts. Each DFE-compensated error count may besimilarly generated by comparing decisions from the eye sampler using aDFE-modified voltage offset to corresponding data decisions of thesequence of data decisions generated by the data sampler. The set ofDFE-compensated error counts are generated based on decisions formed atthe reference sampling instant used to sample data, e.g., near thecenter of the eye. In some embodiments, the DFE-modified offset voltagecorresponds to a voltage offset that is dynamically modified accordingto a set of DFE-correction values. While the voltage offset associatedwith the given measuring point may remain constant, the DFE-modifiedoffset voltage for which the decision is ultimately made may dynamicallyshift according to the set of DFE-correction values. In someembodiments, the method further includes generating the DFE-modifiedvoltage offset by selectively applying historical DFE correction factorsto a respective voltage offset of the plurality of voltage offsets atthe eye sampler. In some embodiments, a DFE-offset voltage generator1610 as shown in FIG. 16 may be configured to generate an analogsummation of the voltage offset ‘V_offset’ with the set of historicalDFE-correction factors ‘DFE_taps’. In some embodiments, the offsetvoltage ‘V_offset’ may be provided off-chip as a parameter while theDFE-correction factor ‘DFE_taps’ may be generated on-chip using datahistory and predetermined DFE tap values that are determined e.g., bymeasuring ISI characteristics of the channel. Each DFE tap value may bea constant value that has a sign applied to it by a correspondinghistorical data bit. In some embodiments, the immediately prior DFEcorrection factor may be included either directly if it is available,or, provided speculatively. Furthermore, pattern filtering may beapplied to effectively apply the immediately prior DFE correctionfactor. Further shown in FIG. 16 is an enable signal ‘en’ configured toselectively apply the DFE_taps when generating the DFE-compensated errorcounts. In some embodiments, when generating the uncorrected errorcounts, the DFE-offset voltage generator may simply pass the offsetvoltage V_offset to the eye sampler. Other switchingcircuits/multiplexing circuits may be used as well.

Alternatively, the DFE-correction values may be applied directly to thereceived data signal. Such an embodiment is illustrated in FIG. 18,where a cascaded integrate-and-hold sampler structure applies threehistorical DFE-correction values via integration stages 1810, and theDFE-corrected data signal is applied directly to the data sampler 1820and the eye sampler 1840.

In some embodiments, each error count of the set of error counts andeach DFE-compensated error count of the set of DFE-compensated errorcounts are stored in a respective counter (which may also be referred toas a register, and which may be accessible to an input/output circuit ofa circuit die, or chip, to allow such values to be read by external testequipment). As shown in FIG. 17, blocks 1705 may correspond to countersfor storing each error count and DFE-compensated error count. In someembodiments, each error count of the set of error counts and eachDFE-compensated error count of the set of DFE-compensated error countsare further generated responsive to detection of a respective datapattern. In the example of FIG. 17, each block 1705 may be an errorcount associated with a respective data pattern and may be updated withthe result of the comparison of decision ‘Eye’ received from the eyesampler to data decision ‘D’ received from the data sampler. Such datapatterns may be e.g., triplet data patterns, such as ‘011’ or ‘101’. Insome embodiments, the set of error counts and set of DFE-compensatederror counts are generated using at least one logical XOR gate connectedto an output of the eye sampler and an output of the data sampler, asshown in FIG. 17.

FIG. 5 is a flowchart of a method 500, in accordance with someembodiments. As shown, method 500 includes generating 502, with a localoscillator and an adjustable phase interpolator, a data sampling clockand a variable-phase-offset eye measurement clock, generating 504 asequence of data decisions by sampling the received data signal at areference sampling instant at a reference voltage offset using a datasampler and the data sampling clock. The method includes generating 506a plurality of eye characteristic measurements using at least one eyeslicer and the variable-phase-offset eye measurement clock, by adjustinga sampling threshold of an eye slicer and a phase offset of theeye-measurement clock. The method further includes generating 508 aplurality of eye characteristic measurements using the data samplingclock and a DFE correction, by adjusting a sampling threshold of an eyesampler, and calculating 510 a vertical offset correction betweencomparable measurements with and without DFE correction at the referencesampling instant, and applying 512 the calculated vertical offsetcorrection to displayed eye characteristic measurements.

In another embodiment, a sweep may be made over a predetermined range ofvoltage offsets and over a predetermined range sampling instants,recording the measurement results for each such combination. In thisexample, these measurements will be performed on the unequalizedwaveform shown in FIG. 6, without benefit of DFE correction, resultingin the uncorrected eye diagram as shown in FIG. 7. In some embodiments,error counts are generated that are associated with two different datapatterns (i.e. the rate of errors seen at that measurement point inwhich a zero is detected instead of a transmitted one, and in which aone is detected instead of a transmitted zero, respectively). Thewaveform of FIG. 8 illustrates a color-coded eye diagram illustratingwhen resolved data decision of the current bit is a ‘1’ (the blackportion) and when the resolved data decision of the current bit is a ‘0’(the grey portion). In some embodiments, the recorded error counts maybe maintained as a table or other comparable data structure. It shouldbe noted that simple display of this non-DFE corrected information maynot accurately represent behavior of a DFE-corrected data detectioncondition. Below, methods and systems are described for generating setsof error counts and sets of DFE-compensated error counts, as well as howsuch error counts may be utilized to modify non-DFE correctedmeasurements to produce a DFE-corrected eye diagram as shown in FIG. 9.In some embodiments, the most immediate previous data bit may have notyet been resolved. In such embodiments, DFE-correction may still beperformed for a set of taps excluding the DFE correction factor for themost immediate previous unit interval (referred to herein as “h1”). ADFE-corrected eye diagram of such a scenario is shown in FIG. 12.

To facilitate subsequent explanations, an embodiment is assumed in whicherror counts and DFE-compensated error counts are further processed into“contour lines” of points having an equal BER. Such processing may occuroff-chip, by e.g., a diagnostic tool. Each BER contour line spans arange of voltage offsets and sampling instants, as shown in FIG. 10.Thus, as one example, the contour line representing a BER for received‘1’ errors of 10⁻⁹ (i.e. one error in 10⁹ received bits) may correspondto the generally-accepted innermost “upper edge” of an open eye, and thecomparable contour line for received ‘0’ errors may correspond to thegenerally accepted innermost “lower edge” of the open eye. As thisinformation was obtained without DFE correction, the resulting “eyeopening” 605 will be small, and indeed may not exist at all. That is, acontour line corresponding to a particular BER for ‘1’ data values maybe lower than the contour line corresponding to the same BER for a ‘0’data value, as illustrated by e.g., the external portions of the 1e-9BER contour lines to the left and right of the intersections of theinternal portions 1e-9 BER contour lines that form the eye opening 605.In some embodiments, BER contours may be associated with data patterns.FIG. 11 illustrates BER contours for two different data patterns, inaccordance with some embodiments. The top waveform illustratesidentified BER contours for a 1-to-1 data pattern, while the bottomwaveform illustrates identified BER contours for a 1-to-0 data pattern.The BER contours of FIG. 11 may be combined to form the eye-openings forcertain BERs as shown in FIG. 10.

In some embodiments, a method includes obtaining a set of error countsfor non-DFE corrected data, and responsively identifying non-correctedBER contours based on the obtained set of error counts. The top-leftdiagram of FIG. 13 illustrates BER contours without any DFE correction.The method further includes obtaining a set of DFE-compensated errorcounts that are made along the reference sampling instant andidentifying DFE-compensated BERs shown as the three dots in thetop-right diagram of FIG. 13. A DFE-compensation offset may beidentified by comparing the voltage offset associated with a givenDFE-compensated BER to the voltage offset associated with the same BERvalue of an uncorrected BER. Such DFE-compensation offsets may beidentified for multiple BERs. Subsequently the uncorrected BER contoursof the top-left diagram of FIG. 13 may be shifted upwards by theidentified DFE-compensation offset. Similarly, the uncorrected BERcontour lines of the bottom-left diagram of FIG. 13 may be shifteddownwards based on the DFE-compensated BERs identified in thebottom-right diagram of FIG. 13.

FIG. 14 illustrates eye diagrams of data signals on traces without andwith DFE (top-left and top-right, respectively), and illustrates theadjustment of the uncorrected BER contour lines of the bottom-leftdiagram of FIG. 14 to form the DFE-compensated BER contour lines of thebottom-right diagram of FIG. 14. FIG. 15 similarly illustratesadjustment of uncorrected BER contour lines according to theDFE-compensation offset determined by the DFE-corrected BERs at thereference sampling instant.

To correct this condition, a scan is performed over a predeterminedrange of amplitude thresholds, but solely at the reference samplinginstant corresponding to the normal data sampling time, which may be ata sampling instant near the center of the signaling interval. Becausethis reference sampling instant is fixed, DFE correction (bothspeculative and non-speculative) may be applied; as previously describedspeculative results may be obtained using a single sampler by discardingresults where the anticipated correction did not match the actual datavalue subsequently detected. The amplitude thresholds so obtainedcorrespond to particular errors versus counts of values received, eachcombination being associated with a BER; in embodiments maintainingseparate one's errors and zero's errors, each combination may beassociated with two BERs, one for each separate error count.

BERs for 1's and 0's are compared to those obtained at the referencesampling instant without DFE compensation, and the incremental amplitudedifference between the DFE and non-DFE measurements are retained.Subsequently, a display processor may graphically synthesize a correctedeye diagram by plotting BER contour lines based on non-DFE measurements,using the amplitude correction determined to exist for that BER betweennon-DFE and DFE measurements. BER values may also be depicted accordingto a color or greyscale mapping of the values.

In a typical case, the amplitude corrections for 1's BER will result inthe contours moving up (towards greater threshold values) and for 0'sBER moving down (towards lesser threshold values). Similarly, in mostcases the threshold differences between smaller and larger BER contourswill decrease when such corrections are applied.

In some embodiments, the BER-specific correction values are obtainedusing BER data gathered from the received sets of error counts andDFE-compensated error counts obtained at the reference sampling instant(e.g., as determined by the timing obtained from the clock and datarecovery circuit). A particular BER value (assuming some level ofquantization/rounding) may occur in a non-DFE corrected signal when acorresponding particular offset voltage is applied to the decisioncircuit/slicer. The same (quantized) BER value could occur inassociation with a DFE-corrected receive signal and/or DFE-modifiedoffset voltage, but at a different absolute offset voltage. Thedifference between these two offset voltage values associated with thesame BER (one DFE corrected, one non-corrected) are an exemplary measureof the improvement due to the DFE circuit operation. Such aDFE-compensation offset may then be used to update the voltage offsetsfor BER measurements made across all timing offsets; not just those madeat the reference sampling instant near the center of the eye.

In at least one embodiment, parameters indicative of the sampling offsetand the voltage amplitude offset are provided to a chip, which may thengenerate error counts for a plurality of sampling instants and voltageamplitude offsets, and DFE-corrected error counts at the referencesampling instant for a plurality of DFE-modified offset voltages. Sucherror counts may be output from the chip, to a system that may beconfigurable to calculate one or two BERs associated with the receivedset of error counts and set of DFE-corrected error counts for theprovided parameters. For example, referring to FIG. 6, a chip mayreceive the sampling offset parameter that is indicative of a samplinglocation along the X axis. The chip may rotate the phase of the samplingclock according to the provided sampling offset parameter using phaseinterpolator PI, adjust a decision threshold voltage (e.g., the Y axis)of a comparator according to the received voltage amplitude offset, andresponsively provide a corresponding error count for that particularmeasuring point. The error counts may be associated with error ‘1s’ thatshould have been ‘0s’, and vice versa, In some embodiments, an array ofparameters may be provided as measuring points to fill out the measuringpoints or “blocks” of a “BER grid” or “BER pixels” in which the x-axiscoordinate of a given block corresponds to the plurality of samplinginstants, the y-axis coordinate of the given block corresponds tovariation in the voltage amplitude offset, and the value(s) inside thegiven block corresponds to the calculated BER(s).

By comparing the DFE-corrected and uncorrected sets of BER values andtheir corresponding voltage offsets, the improvement in the eye openingof the received signal due to the operation of the DFE circuit may beobtained. That is, a given BER may occur at an offset voltage of 0.1volt (again, obtained by sampling at a sampling instant near the centerof a signaling interval) in a non-DFE corrected received signal, whilethat BER may be obtained with a voltage offset of 0.3 volt when samplinga DFE-corrected received signal at the reference sampling instantcorresponding to center of the signaling interval. Thus, the eye may beopened by 0.2 volt at that given BER. Alternatively, a diagnostic checkmay be performed amongst a subset of measuring points, e.g., 10different sampling instants, against 4 different offset voltages for atotally of 40 measuring points. Such a diagnostic check may occur in anoff-chip system and may provide the parameters to the eye sampler (e.g.,the desired sampling instant and voltage offset) for each measuringpoint and may observe the set of error counts for all of the measuringpoints and the set of DFE-compensated error counts for each measuringpoint at the reference sampling interval. Based on an analysis of theset of error counts and set of DFE-compensated error counts, thediagnostic check may identify a DFE-compensation offset and evaluate ifeach uncorrected error count is within a sufficient threshold asmodified by the DFE-compensation offset.

The eye-scope BER data may be obtained horizontally across they eye(using many sampling instant offsets) without using any DFE correction.The set of eye-scope BER measurements, in one embodiment, is a tripletof data values, having (i) an associated sampling offset relative to theeye-center sampling instant, (ii) a voltage offset value representing avoltage offset applied to alter a decision threshold, and (iii) theresulting measured eye-scope BER value made based on the received set oferror counts and the received set of DFE-compensated error counts. Thisis often visualized as an x value (time offset), a y-value (a sliceroffset), and a magnitude (a color or grey scale pixel value) so that aneye diagram may be visualized. In some embodiments as described above,the set of eye-scope BER measurements may include two different BERsassociated with respective error types (e.g., a first error type inwhich is should have been 0s and a second error type in which 0s shouldhave been 1s).

The “raw” eye scope BER data (non-DFE corrected) may be adjusted toreflect what a DFE correction circuit would likely have been able togenerate. The set of DFE-adjusted eye-scope BER measurements aregenerated by using the DFE-compensation offset to adjust the voltageoffset values of the non-DFE corrected eye-scope BER measurements. Thatis, for each triplet in the eye-scope BER data, the eye-scope BER isused to find a matching DFE-compensation offset value. That compensationvalue may then be used to adjust (add or subtract, as appropriate) theoffset value of the triplet. Once all the values are adjusted they maybe visualized/plotted as described above to generate a DFE-corrected eyeplot as shown in FIG. 9. Note that some compression may occur, where,after adjustment, some vertical/voltage offset values may be associatedwith more than one BER rate. In such case, the BER rates may be addedtogether, or alternatively, the smaller of the BER rates may bediscarded.

In some embodiments, a method includes obtaining respective error countsfor a plurality of measurement points, each measurement pointcorresponding to a data decision at a respective sampling instantaccording to a respective offset voltage, and obtaining respectiveDFE-compensated error counts for a subset of measurement points of theplurality of measurement points, the subset of measurement pointscomprising measurement points taken at a reference sampling instant at aplurality of DFE-modified voltage offsets. The method may furtherinclude determining a DFE-compensation offset based on a selectedDFE-compensated error count and a corresponding error count for ameasurement point taken at the reference sampling instant near thecenter of the eye. In such embodiments, the selected DFE-compensatederror count and the corresponding error count may have equivalentbit-error rates, and different offset voltages. The DFE-compensationoffset thus corresponds to a voltage difference between the differentoffset voltages. In some embodiments, the method further includesapplying the DFE-compensation offset to BER contour lines generated fromuncorrected data to generate a corrected eye diagram. Alternatively, theDFE-compensation offset may be used as a diagnostic by checking if apredetermined set of measurement points are operating within a giventhreshold standard

In one particular embodiment, a measurement circuit maintains a numberof error counts, each associated with a particular received data pattern“filter” composed of a preceding received data bit, current data bit,and following data bit. Thus, in one example a first error counterconfigured with the filter “1, 1, 0” will count a detected “0” value asa bit error (as it does not agree with the current data bit “1”configured in the filter and received in the matching data sequence)only if preceded by a received data “1” and followed by a received data“0”. In a first embodiment the total number of times each filtersequence is matched is also counted, allowing interpretation of thecounted errors as a BER. In a second embodiment the measurement circuitoperates autonomously for a predetermined number of filter sequencematches, at the end of which its error counter result may be observedand so interpreted.

When configured to verify BER values by measuring over millions orbillions of data values, simple binary error counts may provideunnecessary accuracy. In practice, only an indication that, as examples,a few errors, thousands of errors, or millions of errors were seen atthe specified measurement point may be required. Thus, interpreting theresulting error counts in a logarithmic or reduced-precision numericformat may be advantageous. One particular measurement circuitembodiment maintains 24-bit binary error counters for implementationconvenience but presents the resulting error counts and/or BER values toan eye-scope computation in a pseudo floating-point numerical format,comprising several of the most significant bits of the actual countvalue (the “fractional” portion), and additional bits indicating anexponential multiplier or scale factor (the “exponent” portion). Thus,an example binary counter value of 0001 1011 1001 0011 may be convertedinto a three-bit fractional “110” and a five-bit exponent “1100”indicating the fraction should be left-shifted by 12. No limitation isimplied by this example, either in formatting of the values or in thesize of its comprising numerical fields.

We claim:
 1. A method comprising: generating, using a data sampler, asequence of data decisions at a reference sampling instant using areference voltage; generating a set of error counts, each error countgenerated by comparing decisions from an eye sampler formed at arespective sampling instant of a plurality of sampling instants using arespective voltage offset of a plurality of voltage offsets tocorresponding data decisions of the sequence of data decisions; andgenerating a set of DFE-compensated error counts, each DFE-compensatederror count generated by comparing decisions from the eye sampler formedusing a DFE-modified voltage offset at the reference sampling instant tocorresponding data decisions of the sequence of data decisions.
 2. Themethod of claim 1, wherein each error count of the set of error countsand each DFE-compensated error count of the set of DFE-compensated errorcounts is stored in a respective counter.
 3. The method of claim 1,wherein each error count of the set of error counts and eachDFE-compensated error count of the set of DFE-compensated error countsare further generated responsive to detection of a respective datapattern.
 4. The method of claim 3, wherein the respective data patternis a triplet data pattern.
 5. The method of claim 1, wherein the set oferror counts and set of DFE-compensated error counts are generated usingat least one logical XOR gate connected to an output of the eye samplerand an output of the data sampler.
 6. The method of claim 1, furthercomprising generating the DFE-modified voltage offset by selectivelyapplying historical DFE correction factors to a respective voltageoffset of the plurality of voltage offsets at the eye sampler.
 7. Themethod of claim 6, wherein the historical DFE correction factors areanalog signals.
 8. The method of claim 7, wherein the historical DFEcorrection factors are selectively applied to a received data signal. 9.The method of claim 1, wherein generating the sequence of data decisionscomprises speculative DFE.
 10. The method of claim 1, further comprisingoutputting the set of error counts and the set of DFE-compensated errorcounts.
 11. An apparatus comprising: a data sampler configured togenerate a sequence of data decisions at a reference sampling instantusing a reference voltage; an eye sampler configured to: generatedecisions at a respective sampling instant of a plurality of samplinginstants using a respective voltage offset of a plurality of voltageoffsets; and generate DFE-compensated decisions formed using aDFE-modified voltage offset at the reference sampling instant; and anerror count circuit configured to: generate a set of error counts, eacherror count generated by comparing the decisions from the eye sampler tocorresponding data decisions of the sequence of data decisions from thedata sampler; and generate a set of DFE-compensated error counts, eachDFE-compensated error count generated by comparing the DFE-compensateddecisions from the eye sampler to corresponding data decisions of thesequence of data decisions from the data sampler.
 12. The apparatus ofclaim 11, wherein the error count circuit comprises respective countersto store each error count of the set of error counts and eachDFE-compensated error count of the set of DFE-compensated error counts.13. The apparatus of claim 11, wherein the error count circuit isconfigured to generate each error count of the set of error counts andeach DFE-compensated error count of the set of DFE-compensated errorcounts responsive to detection of a respective data pattern.
 14. Theapparatus of claim 13, wherein the respective data pattern is a tripletdata pattern.
 15. The apparatus of claim 11, wherein the error countcircuit comprises at least one logical XOR gate connected to (i) anoutput of the eye sampler for receiving the decisions and theDFE-compensated decisions and (ii) an output of the data sampler forreceiving the sequence of data decisions.
 16. The apparatus of claim 11,further comprising a DFE voltage generator configured to generate theDFE-modified voltage offset at least in part by selectively applyinghistorical DFE correction factors to a respective voltage offset of theplurality of voltage offsets at the eye sampler.
 17. The apparatus ofclaim 16, wherein the historical DFE correction factors are analogsignals.
 18. The apparatus of claim 17, further comprising an inputsampling stage configured to apply one or more of the historical DFEcorrection factors to a received data signal.
 19. The apparatus of claim11, wherein the data sampler is configured to apply speculative DFEcoefficients to a received data signal.
 20. The apparatus of claim 11,wherein the error count circuit is configured to output the set of errorcounts and the set of DFE-compensated error counts.